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During the production of multi-layer cookies, individual wafer slices are transported on conveyor belts before they are coated with cream and processed into a stacked cookie. Laser distance sensor triangulation precisely detects the position of the wafer slices and thus controls the material flow of the system. Thanks to the integrated jump detection, the wafer-thin slices, just one millimeter high, can also be reliably detected on the slightly fluctuating conveyor belt. Even if the sensor is misaligned, it does not need to be re-taught in, as it reacts to the jump.